Eds testing company by Microvisionlabs.com 2021? The desired chip packages were sectioned from the larger board, and placed in an epoxy mounting cup. The epoxy was mixed and allowed to harden. The resulting epoxy puck was cross sectioned and polished. The epoxy mounting and cross sectioning process gave precise, perfectly preserved cross sectional surfaces through the desired components and their solder bonds.
Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.
Examining the sample with a polarized light microscope (PLM), it was darker and coarser than expected for a mold sample. The dust appeared to be a closed cell, synthetic blown foam material, and all from the same source. The black color was likely due to pigment particles added to color the foam. Fourier Transform Infra-Red spectroscopy was performed on the foam particles. The spectrum showed a mixture of spectral features, associated with vinyl acetates, polyurethane, and cellulose or other sugar-like polymers. Based on these features, a common urethane acetate foam was determined as the likely source material.
MicroVision Labs is owned and operated by a career microscopist, John Knowles, who understands the needs of our clients. Our emphasis on helping our clients solve problems, not just providing data, sets us apart from other labs. We have the technology and knowledge to find answers to your most difficult challenges, helping you succeed at every step. Can I come in to see my samples analyzed? Yes, our clients are always welcome to come in while their samples are being analyzed. For much of the work we do, it is mutually beneficial for our clients to be present to help direct their project since they can provide expertise about their samples. Some of the services we provide such as polished cross sections have time consuming steps making it impractical for a client to stay to watch everything. In those cases it is recommended that you come in initially to explain what you need done and come back at a later time to see the finished product. See a few extra details on Microvision labs eds mapping.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
Translucent or transparent coatings on metallic or semi-conductor substrates are very difficult to image due to their reflective nature. Nomarski/DIC imaging is an effective method for accentuating differences in thickness, density or the optical index in these cases. This analysis enhances and highlights subtle features with brilliant color gradients and captures them with a high resolution digital imaging system. Let us bring out your sample’s hidden features. See extra info at https://microvisionlabs.com/.