Sem/eds analysis company in Chelmsford today

Microscopy services in the USA in 2021? Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.

SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.

What if I want a service not listed in your services list? At MicroVision Labs the list of services which we provide to our clients is constantly growing. So if you don’t see what you are looking for give us a call or use the Contact Us tab. Also don’t forget to check our Additional Services Page to see if it might be listed there. Can you identify a contamination or unknown for us? Yes, we call that an Unknown Material ID and we routinely work on that kind of project. We have a number of individual tests designed to classify unknown materials. When combined with our extensive suite of equipment, these tests allow us to identify virtually any material. Give us a call and talk to one of our knowledgeable staff for more information. Explore extra info on find more info. We are proud to announce that MicroVision Labs is now accredited to the ISO/IEC 17025:2017 standard. This represents over a year of diligent effort from all of our staff to verify and validate our in house SOP’s and transform our quality management system to one that is compliant to this international standard. This certification requires that accredited labs demonstrate that they are competent and can produce technically valid data and results unlike other certifications such as ISO 9001:2015. This represents an obvious value to our clients.

The client was contacted with the results, and was curious as to what the source of these particles might be. After consulting with the office manager, it was determined that some pieces of furniture present had relatively significant amounts of direct water exposure, and were subsequently dried a number of times during remittance construction. Inspection of these pieces of furniture showed that they had high density, close packed foam cushions of a type similar to the particles observed in the surrounding area, which had been broken down by the repeated wet/dry cycle.

Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin. Discover even more info on https://microvisionlabs.com/.

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